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Connector Inspection Pin Tip True Position (TP) Measurement

  
  
  
  
  

One of the most common inspection requirements for a connector assembly is verifying the Pin Tip True Position (or TP).  This inspection verifies that the X/Y position of the pin tip is within the radial tolerance of its expected location, as defined by the part drawing.  The sketch below shows a general TP specification with actual values.

True Position Measurement Drawing

This type of inspection can easily be performed by IMPACT software.  Typically, there are four steps to completing this inspection.

1.       Establishing the TP datum reference edges or points.

2.       Establishing the TP ideal (expected) locations.

3.       Locating the actual pin tip positions of the current part under inspection.

4.       Checking the actual TP versus the expected TP.

The following sections describe how IMPACT tools are used to implement this inspection.

 

Establishing the TP datum reference edges

Any number of origin locator type tools can be used, depending on the image attributes and datum points.  For example, if the datum points are based on “holes” and the image is backlit, then using a Blob tool, which reports centroids, in combination with a Linear Regression tool can establish a valid datum reference.  Another example uses the Origin tool, with its sub-pixel capability, to establish the datum reference.  In any case, the established datum reference should correspond to the datum reference that is called out on the part drawing.

Connector Image Showing Datum Lines for True Position Measurement

 

Establishing the TP ideal (expected) locations

In an ideal inspection, the expected TP locations are derived from the part drawing.  Typical TP specs are called out in a grid configuration with a specific X/Y pitch or offset.  From this drawing data, you can calculate the X/Y point pair locations of the ideal grid using the BASIC tool. (See the example below.) 

VPM Basic Tool showing True Position Measurement Calculations

In a more relaxed specification, you can employ the Point Match tool’s “trainable” ideal point list, where it is trained with the current pin tip locations as the ideal, assuming that the current part is the “golden standard.” (See the example below.)

VPM Properties for Point Match tool

 

Locating the actual pin tip positions

The most common way to locate the pin tips is with a Blob tool.  Prior to blob detection though, you might want to use image morphology tools to improve the image quality of the pin tips.  Many times the chamfer, cut-off methods, and plating can degrade the pin tip image quality.  Employing morphology tools can make the pin tip more defined and contiguous by growing and merging blobs together. 

Connector Pins Before Morphology

Once the image is improved with morphology tools, the Blob tool can detect these pin tips and report the centroid information.  One additional feature of the Blob tool is a “Single Blob per ROI” filter setting that can also help improve robustness.  With this setting, the tool can filter blobs to find the centermost or largest blob. This helps resolve a multiple blob scenario that may be beyond the morphological tool’s filtering capability or be the result of the threshold operation. (See the example below.)

Connector Pins After Morphology

 

Checking the actual TP versus the expected TP

There are two tools in the IMPACT software suite, Point Match and Grid Statistics, which analyze TP data.  The Point Match tool checks the actual point list against the ideal points list.  Since the point data is not required to be in any particular order, the points are first analyzed to find “matching” points corresponding to the ideal list.  Once all points are matched, they are then checked to see if they are within the positional radial tolerance (TP tolerance).  Missing points or points outside the tolerance are identified as failures. The example below shows two points outside the tolerance.

Connector Pins Showing Difference Between Actual TP and Expected TP

The Grid Statistics tool does a similar, but more extensive, point matching analysis.  The tool not only does the same tolerance check as the Point Match tool, but it also does a “Grid Fit” calculation that allows the entire grid to move within a specified tolerance.  This type of Grid Fit inspection is useful for Ball Grid Array (BGA) type inspections. (See the example below.)

Pin Grid Showing True Position of Pins in an Assembled Connector

In summary, the PPT VISION IMPACT Software Suite has the analysis tools needed to perform True Position (TP) type inspections.  The Origin, Morphology and Blob tools can be implemented to robustly find the datum edges and the pin tips.  The Point Match and Grid Statistics tools can perform simple point matching or more complex grid analysis algorithms to determine the pass/fail status of the part under inspection.

To learn more about the PPT VISION IMPACT software, you can download a free version of the software at www.pptvision.com. or read about these analysis tools and many more here.

Comments

Nice article. The benfits of true positioning are really for the inspection process and the acceptance of material that might have in the past been unacceptable.  
 
I liked the write-up and think vision system inspection is a good way to go when dealing with TP dimensioned prints. Does the software deal with min and mx material conditions? 
 
 
 
Posted @ Sunday, March 06, 2011 2:13 PM by Brian B
Brian B, 
Thanks for the comment and question. 
Of the tools profiled in the article (Blob, Point Match, Grid Statistics), only the Grid Statistics tool can compensate for Min & Max Material conditions (MMC). 
The Grid tool does a best fit operation to fit the actual points to the ideal point grid. 
This is done to compensate for datum locating errors, such as any MMC that would affect the datum reference. 
 
Although it was not discussed in the original article, the tools and methods used to establish the datum reference points/lines are very critical to the usage of these point/grid tools. 
And if needed, one could also use additional math (or Basic tool) to adjust or compensate for the MMC of the datum edges. 
In all cases, the lighting and visibility of the datum edges is critical. 
 
Brian R.
Posted @ Monday, March 14, 2011 7:29 AM by Brian Robertson
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